The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 1988

Filed:

Aug. 06, 1986
Applicant:
Inventors:

Takeshi Kimura, Tokyo, JP;

Kozo Mochiji, Tokyo, JP;

Hiroshi Okamoto, Tokyo, JP;

Takao Iwayanagi, Tokyo, JP;

Tetsuichi Kudo, Tokyo, JP;

Shinji Kuniyoshi, Tokyo, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03F / ;
U.S. Cl.
CPC ...
430-5 ; 430296 ; 430325 ; 430327 ; 430330 ; 430966 ; 430947 ; 430942 ; 378 35 ;
Abstract

There is disclosed a mask for X-ray lithography wherein a peroxopolytungsten compound is used as an absorber, and a process for producing the same. Since this compound has a sensitivity for electron beams and light and serves as an absorber for X-rays, a mask for X-ray lithorgraphy is made only by applying this compound to a substrate, exposing the same to light to form a transferred pattern, and effecting development. Thus, the step of etching the absorber which is essential in the conventional process, is not needed. Therefore, masks having a highly accurate pattern and few defects can be produced with a high production yield.


Find Patent Forward Citations

Kimura, Takeshi. (1988). Mask for x-ray lithography and process for producing the same (U.S. Patent No. 4719161). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4719161

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