The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 1988
Filed:
Mar. 20, 1985
Koichi Uchino, Katsuta, JP;
Yoshimasa Hamano, Katsuta, JP;
Hitachi, Ltd., Toyko, JP;
Abstract
In a method of analyzing a sample by measuring retention time of the components of the sample, a method of ananlysis by chromatogram which displays schematic chromatograms related to particular fillers and particular object components to be analyzed, relying upon the retention time and half widths of various object components to be analyzed that have been stored and are related to various fillers to be charged into the separation column. The invention further deals with a chromatogram analysis apparatus comprising means which stores the retention time and half widths of objects components to be analyzed related to various fillers that are to be charged into the separation column, and means which prepares schematic chromatograms related to particular fillers. Schematic chromatograms are displayed to efficiently and quickly select a filler that is suited for the analysis of saccharide. The apparatus for analysis can be used independently, or as a component of the chromatograph data processor.