The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 12, 1988

Filed:

Dec. 17, 1986
Applicant:
Inventors:

Arthur E Chiou, Newbury Park, CA (US);

Pochi A Yeh, Thousand Oaks, CA (US);

Assignee:

Rockwell International Corporation, El Segundo, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B / ;
U.S. Cl.
CPC ...
350163 ; 350370 ; 364800 ;
Abstract

A phase conjugate interferometer includes a source of coherent light and a first beam splitter for dividing the coherent light into a transmitted portion and a reflected portion. A second beam splitter is positioned to divide the transmitted portion into an outgoing transmitted beam and an outgoing reflected beam, with the outgoing transmitted beam oriented to pass through the first image and the outgoing reflected beam oriented to pass through the second image. A phase-conjugate reflector is positioned to reflect the outgoing transmitted beam as a first incoming beam and the outgoing reflected beam as a second incoming beam. The incoming beams are directed toward the second beam splitter, which divides the incoming beams into a first combined beam and a second combined beam. The second combined beam is directed toward the first beam splitter, which divides the second combined beam into a third combined beam and a transmitted beam. With this arrangement, the first combined beam contains the difference between the intensities of the first and second images and the third combined beam contains the sum of the intensities of the first and second images.


Find Patent Forward Citations

Loading…