The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 05, 1988
Filed:
Oct. 28, 1985
John M Richardson, Duncan, OK (US);
Richard L Duncan, Duncan, OK (US);
Halliburton Company, Duncan, OK (US);
Abstract
A method of discriminating between linear and nonlinear regions of measured data is based upon two hypotheses, one of which is a hypothesis that a response is merely a result of inherent randomness and the other of which is a hypothesis that the response is a result of a true nonlinear change greater than a value M. It is also based upon a relative cost between accepting the latter hypothesis when the former is true versus accepting the former hypothesis when the latter is true. A resulting probabilistic criterion (M/2)+(.sigma..sup.2 /M) [1n(P.sub.H0 /P.sub.H1)C] is graphically implemented for deriving offset values which can be used in a specific embodiment to construct tabular values defining linear/nonlinear regions from a presumed hypothetical straight line response.