The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 29, 1987
Filed:
Apr. 26, 1985
Nissan Motor Company, Limited, Yokohama, JP;
Abstract
A method for detecting flaws in a surface of an inspected object can moderate the requirements for inspection condition accuracy, particular for adjustment of spatial relationships among a laser unit, the surface and an laser detector unit. The method includes the step of transmitting a laser beam in a known configurationonto a specular surface of the inspected object, projecting the laser beam reflected by the surface onto a light-scattering screen and forming an image of the surface on the screen, and detecting the image of the surface in the known configuration in relation to a predetermined portion of the screen. An apparatus carrying out the method includes a sensor for detecting positional deviation of the image of the surface from a fixed monitored portion of the screen, a adjuster for adjusting the angle subtended by the axes of a transmitter of the laser slit beam and a flaw-detecting image sensor and an adjuster for adjusting the inclination of a plane defined by the axes of the transmitted and the flaw-detecting image sensor relative the surface, both adjusters operating in accordance with the output of the deviation detecting sensor.