The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 22, 1987
Filed:
Feb. 05, 1985
Applicant:
Inventors:
Toshio Fujita, Yokohama, JP;
Kouzi Hasegawa, Kamifukuoka, JP;
Assignee:
Kett Electric Laboratory, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
364563 ; 324230 ; 7315 / ;
Abstract
An instrument for measuring a thickness of a surface processing film on a metal includes a plurality of instruction executing keys, an enclosed recording apparatus, a terminal for connecting a probe to detect an electrical signal corresponding to the film thickness when the probe is pressed onto the metal, a circuit for converting the electrical signal obtained from the probe to a digital value indicative of the film thickness, and a circuit for arithmetically processing the digital value in accordance with instructions by the instruction executing keys. The results of the processing are outputted to the recording apparatus.