The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 15, 1987
Filed:
Mar. 10, 1983
Kazuo Nunokawa, Tokyo, JP;
Tokyo Kogaku Kikai Kabushiki Kaisha, Tokyo, JP;
Abstract
Ophthalmoscopic instrument having working position detector. An object lens has an optical axis and is adapted to be positioned to confront a patient's eye at a working distance. The patient's cornea has a center of curvature. An observing optical system focuses a light beam reflected from the eye and passing through an objective lens on an image plane. A detecting system detects that the eye is properly positioned with respect to the objective lens. The detecting system includes at least two apertures allowing light beams from a single target mark to pass therethrough. A target mark projection system projects the beams passed through the respective apertures in directions crossing each other on the optical axis of the objective lens so that a target mark image is formed at the center of curvature of the cornea when the eye is properly positioned with respect to the objective lens. A target mark image plane forms a target mark image by mirror reflection from the cornea of the light beams projected through the target mark projection system when the patient's eye is properly positioned, and a target mark image observation system provides observation of the target mark image on the target mark image plane in superposition with a reference mark.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile