The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 08, 1987
Filed:
Dec. 12, 1986
Applicant:
Inventors:
Geert Wijntjes, Belmont, MA (US);
Michael Hercher, Marblehead, MA (US);
Assignee:
Beckman Instruments, Inc., Fullerton, CA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356346 ; 318640 ; 356349 ; 356351 ;
Abstract
An improved mirror alignment control for dynamically aligning the reflecting mirrors bounding the optical path in an interferometer comprises a closed loop servo control which utilizes a two frequency laser beam to provide phase comparison between beams traversing differing portions of the optical paths in the interferometer to determine alignment of the mirrors, said phase comparison providing a correction signal to direct multi-axial alignment of at least one of the mirrors.
Quick Actions:
Wijntjes, Geert. (1987). Dynamic mirror alignment control (U.S. Patent No. 4711573). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4711573
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile