The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 1987

Filed:

Jan. 29, 1985
Applicant:
Inventors:

Hisakazu Yoshino, Tokyo, JP;

Shinichi Nishimura, Ageo, JP;

Kazuyuki Sasaki, Kanazawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ; A61B / ;
U.S. Cl.
CPC ...
351214 ; 351206 ;
Abstract

A slit lamp comprising a slit light projection optical system having a slit aperture for projecting a slit pattern light along a slit plane to a crystalline lens of a patient's eye and a microscope for observing a section of the crystalline lens which is illuminated by the slit pattern light. The microscope comprises an crystalline lens section recording optical system including a recording device having an image plane for recording the section of the crystalline lens of the patient's eye illuminated by the slit pattern light, and a retroillumination image recording optical system for guiding a retroillumination image of the crystalline lens to the recording device of the crystalline lens section recording optical system for recording the section of the crystalline lens. The crystalline lens section recording optical system including an imaging optical system having a principal plane which intersects an extension of the image plane of the recording device in an extension plan including the slit aperture and the projection optical axis of the slit light projection optical.


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