The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 08, 1987

Filed:

Jan. 03, 1985
Applicant:
Inventors:

Hisakazu Yoshino, Tokyo, JP;

Shinichi Nishimura, Ageo, JP;

Kazuyuki Sasaki, Kanazawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351214 ; 351205 ;
Abstract

An eye disease inspection instrument comprising a slit light projection optical system for projecting a slit light along a projecting optical axis to a patient's eye, a first optical system for observing a crystalline lens of the patient's eye at a section which is being illuminated by the slit light, a second optical system including an objective lens having an objective optical axis substantially coaxial with respect to the projecting optical axis for performing an observation under a retroillumination method.


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