The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 01, 1987
Filed:
Oct. 23, 1985
Jeffrey D Bellay, Houston, TX (US);
Theo J Powell, Dallas, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A test partitionable logic circuit comprises a plurality of functional modules (26a)-(26n). Each of the functional modules is interfaced with the exterior of the logic circuit with a data bus (20), address bus (16) and a control bus (12). Each of the modules (26) is addressable through an address decode/select circuit (52) to operationally isolate the select modules and define a test boundary. Test data is scanned into a serial chain of shift register latches (SRL's) which are connected in a daisy chain configuration. The defined test boundary allows each of the modules to be separately selected and tested such that the test program for an individual module is separate and distinct.