The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 1987

Filed:

Sep. 20, 1985
Applicant:
Inventors:

Daniel A Slater, Rochester, NY (US);

William A Meredith, Rochester, NY (US);

Mark J Devaney, Rochester, NY (US);

Assignee:

Eastman Kodak Company, Rochester, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
422 63 ; 1984651 ; 198748 ; 19880301 ; 422 65 ; 436 46 ;
Abstract

There is disclosed a test element advancing mechanism for use in an analyzer to move such test element from station to station, and a method of doing the same. The mechanism features a support surface over which the test elements move in a predetermined direction, a test element mover for engaging and moving the test elements, means for reciprocating the mover along a surface disposed to one side of the support surface, a portion of said mover being constructed to engage the reciprocating means, and means for pivoting the mover about an axis that extends parallel to the movement direction so that the engaging means are moved into or out of contact with such test elements. The test element mover includes a lever arm emanating from one side of the reciprocating means engaging portion, constructed to interact with the pivoting means. The mover also includes test element engaging means projecting from a side of the reciprocating means engaging portion that is opposite to the side from which projects the lever arm of the mover, for engaging the test elements.


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