The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 01, 1987

Filed:

Sep. 09, 1985
Applicant:
Inventors:

Philip J Wyatt, Santa Barbara, CA (US);

Gregory M Quist, Goleta, CA (US);

Assignee:

Wyatt Technology Company, Santa Barbara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356343 ; 250524 ; 356336 ; 364525 ; 364555 ;
Abstract

An apparatus and process are described for the characterization and/or identification of suspensions of microparticles based upon the measurement of certain optical observables produced as the suspension is illuminated by a beam of light, or other electromagnetic radiation. Selected observables calculated from the scattered radiation detected by a plurality of detectors surrounding the thus-illuminated suspension are then used to recall specific maps, from a computer memory means, one for each observable. The common overlap region of said map yields characterizing or identifying particle suspension physical parameters.


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