The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 24, 1987

Filed:

Mar. 27, 1986
Applicant:
Inventors:

Sadao Mori, Ibaraki, JP;

Toshio Akatsu, Ibaraki, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356358 ; 356351 ; 356363 ; 377 17 ;
Abstract

The magnitude of displacement of an object to-be-measured is measured by projecting light beams on the object to-be-measured and a reference plane and utilizing the interference of lights reflected therefrom. The reflected lights from the object to-be-measured and the reference plane have their phase difference changed cyclically and forcibly. The discontinuous change of the magnitude of phase shift at the moment at which the phase difference of the two reflected lights caused by the displacement of the object to-be-measured has been compensated, and the magnitude of displacement of the object to-be-measured is found from the counted result of the discontinuous changes and the magnitude of phase shift at the moment at which the phase difference has been compensated.


Find Patent Forward Citations

Loading…