The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 1987

Filed:

Jun. 25, 1986
Applicant:
Inventors:

John H Fehn, El Sobrante, CA (US);

Mitsuaki Arakawa, Hillsborough, CA (US);

Barry M McCarten, Piedmont, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324322 ; 324318 ; 324307 ; 128653 ;
Abstract

A pair of co-located RF surface coils extend axially and part-circumferentially about a volume to be imaged. Because surface coils are employed, the RF field distribution will be non-symmetric, non-homogeneous and non-uniform within the volume. Nevertheless, if the two coils are rotationally offset by the proper amount (and possibly including capactive isolation coupling therebetween), the coils produce a pair of RF signals to/from the volume which are in quadrature phase thus providing signal-to-noise ratio improvements due to: (a) the fact that quadrature detection techniques are employed and (b) the fact that only a portion of the cross-sectional volume is effectively addressed by the surface coils (i.e., due to their non-symmetric, non-homogeneous and non-uniform field distribution).


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