The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 17, 1987

Filed:

Aug. 22, 1985
Applicant:
Inventors:

Johannes J Cuppen, Eindhoven, NL;

Johannes P Groen, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324309 ; 324307 ;
Abstract

The invention relates to the determination of an NMR distribution in which an alternating gradient field is applied while sampling the NMR signal (FID signal, nuclear spin echo signal). The frequency of the alternating gradient field is comparatively low (order of magnitude of 100 Hz) and the field has from a few to some tens of cycles during each measurement period. While an FID signal is being sampled, the image frequency field matrix is scanned using a zig-zag (oscillating) line pattern during each line when data is provided for elements in from a few to some tens of rows in the image frequency matrix. By applying preparation gradient fields, the image frequency matrix can be filled by means of successive zig-zag line patterns which have been shifted with respect to one another and which thus enable a uniform sampling density to be provided in the image frequency space. The filling of the image frequency matrix with signal samples is thus speeded up by a factor of a few to some tens of times by the invention, the energy required for controlling the gradient field coils being substantially reduced at the same time.


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