The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 1987
Filed:
Oct. 31, 1985
David A Lowitz, Richmond, VA (US);
Philip Morris Incorporated, New York, NY (US);
Abstract
An impurity detector using scattered electromagnetic radiation from a sample of bulk material. It includes a generator of a narrow beam of modulated and linearly polarized electromagnetic radiation directed toward the sample. One or more radiation detectors, the number depending on generator stability and sample characteristics, are responsive to scattered modulated radiation polarized parallel to the polarization of the radiation from the generator. The one or more detectors generate a signal indicating the intensity of such scattered, modulated, and polarized radiation representing a normal sample's angular scattering spectrum. A change in the output of the detector indicates the presence of an impurity in the sample.