The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 1987
Filed:
Nov. 25, 1985
Applicant:
Inventor:
Fritz J Knorr, Mountain View, CA (US);
Assignee:
Surface Science Laboratories, Inc., Mountain View, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01D / ;
U.S. Cl.
CPC ...
250282 ; 250281 ; 250287 ; 364498 ;
Abstract
A time of flight mass spectrometer includes means for gating the flow of ions from the source to the detector with a modulation function, the frequency of which is swept. The detected ion current is obtained as a function of the ion current modulation frequency to derive an ion mass interferogram output in the frequency domain. The interferogram output is Fourier transformed from the frequency domain to the time domain to obtain a time of flight mass spectrum output in the time domain. The Fourier transform time of flight mass spectrometer provides increased duty cycle and signal-to-noise ratio for a given scan time.