The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 17, 1987
Filed:
Mar. 06, 1986
Thomas G Roberts, Huntsville, AL (US);
Raymond W Conrad, Russellville, AL (US);
Thomas E Honeycutt, Somerville, AL (US);
The United States of America as represented by the Secretary of the Army, Washington, DC (US);
Abstract
A system for measuring the density of certain ions or neutrals within a plasma without probe intervention. When cylindrical symmetry is present, the system also provides measurement of spatial distribution of excited ionic states within the plasma. The system allows spatial distribution of contaminant ions in magnetic confinement thermonuclear fusion devices to be monitored. These functions are accomplished by directing two laser beams through a region containing a plasma. The laser means are at respective wavelengths chosen to be in and closely adjacent to a spectral region near the electronic transition frequency of the ionic species of interest in the plasma. The intensities of the two wavelengths are then measured and compared to obtain the desired data and characterization.