The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 1987
Filed:
Jan. 23, 1986
Johannes H Den Boef, Eindhoven, NL;
U.S. Philips Corporation, New York, NY (US);
Abstract
NMR images formed by means of Fourier zeugmatography contain disturbing artefacts which are caused by coherent interference signals (for example, off-set signals, non-ideal 180.degree. reversing pulses). In accordance with the invention, an additional phase difference (.DELTA..phi.=.pi. in the case of even rows, and .DELTA..phi.=.pi.. (m-1)/m rad/sec in the case of m odd rows) is generated and the signal samples taken from the resonance signals are stored in adjacently situated rows of an image frequency matrix. The values in every second row of the matrix are changed to cancel said additional phase-difference, so that the contributions of the coherent interference signals to the matrix are influenced by the additional phase shift; if the additional phase shift is .pi. rad/sec, the values of every second row of interference signals in the direction of the columns are simply inverted. During Fourier transormation of the columns, therefore, the artefacts caused by the interference signals are shifted towards the border of the image.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile