The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 10, 1987

Filed:

Jul. 25, 1986
Applicant:
Inventor:

Masanori Nukushina, Chofu, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D05B / ;
U.S. Cl.
CPC ...
1122661 ; 112456 ; 11212112 ; 112103 ;
Abstract

Method and apparatus for preparing sewing data for an automatic sewing apparatus which embroiders an embroidery pattern on cloth using a zigzag chain stitch while moving one or both of a cloth retainer and a sewing machine relative to each other. When a pattern corresponding to a basic sewing data group stored in a memory device is to be embroidered either magnified or reduced in size, in order to set a desired stitch density (P), which is the pitch of the stitches, three items of basic sewing data are read out from the memory device as one processing unit. After these items of data have been multiplied by a specified magnification to obtain sewing data (A,B,C), a pattern range which corresponds to the sewing data is divided by a particular stitch density in order to calculate correction data ( .circle.1 to .circle.21 ). Then a plurality of correction data items which correspond to the magnification of the specified stitch density with respect to the particular stitch density are added together to provide sewing data .circle.1 ' to .circle.9 ').


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