The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 1987
Filed:
Mar. 06, 1986
Applicant:
Inventors:
Erich Hofling, Kreuzlingen, CH;
Zdenek Maly, Kreuzlingen, CH;
Assignee:
Swiss Aluminium Ltd., Chippis, CH;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
250571 ; 250228 ;
Abstract
The invention relates to a method and apparatus for the determination of the thickness of transparent, clear or colored, layers of lacquer on bright rolled, metallic foil or thin strip, in particular of aluminium or aluminium alloys, wherein the optical transmission factor (D) of the layer is determined. The attenuation of irradiated light reflected from the metallic surface disposed in an arched configuration is measured in the infrared to visible range after transmission through the layers of lacquer.