The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 1987

Filed:

Dec. 11, 1985
Applicant:
Inventor:

Kanji Kinameri, Nishitama, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356432 ; 356435 ;
Abstract

The present invention relates to viewing a three-dimensional internal structure of a specimen. According to the invention, it is possible to observe the internal structure of a particular cross section of a specimen as clearly differentiated from the other cross sections. The characteristic features of the invention lie in that a plurality of light beams passing through different portions inside the specimen are used, and a correlation among the measurements of transmittance of the plurality of light beams is determined.


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