The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 27, 1987

Filed:

Feb. 26, 1986
Applicant:
Inventors:

Albert Schilling, Aalen, DE;

Edwin Schuttler, Aalen, DE;

Karl-Wilhelm Schmekel, Aalen, DE;

Axel Rohde, Aalen, DE;

Assignee:

Carl-Zeiss-Stiftung, Oberkochen, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ; A47B / ;
U.S. Cl.
CPC ...
350531 ; 108143 ; 350532 ;
Abstract

In addition to providing fine adjustment for precise two-coordinate positioning of a specimen, a microscope stage has a handle for rapid displacement of the stage when the fine adjustment is disconnected. This handle is secured to the underside of the cross-slide (6) of the stage, and in a laterally central position of the stage; the handle also extends through a cut-out in the stage carrier, thereby defining the range of movement of the stage. The arrangement of the handle is ergonomically favorable and reduces the danger of contamination of the specimen. In addition, a rotatable sleeve on the handle enables fine and precise adjustment of the angular orientation of a chucked specimen, with respect to the microscope.


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