The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 27, 1987
Filed:
Jun. 25, 1986
Applicant:
Inventor:
Henri Shaw, Woesten-Vleteren, BE;
Assignee:
N.V. Weefautomaten Picanol, , BE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
D03D / ;
U.S. Cl.
CPC ...
139348 ; 139304 ; 139336 ; 66166 ; 250563 ;
Abstract
Optical scanning and inspection of loomed fabric on one or more looms is carried out using a travelling optical scanner that scans an inspection area of fabric on a loom faster than the fabric traverses the inspection area, such inspection area provided between the weaving portion of the loom and the fabric take-up roll. The scanner generates signals that can routinely be compared with preset reference standards and which can be used to control the stopping of the loom upon the detection of a weaving defect. Fabric moving through multiple looms can be scanned in sequence by a scanner traversing multiple inspection areas of the looms.