The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 20, 1987

Filed:

Jan. 20, 1984
Applicant:
Inventors:

Dietrich W Lubbers, Dortmund, DE;

Norbert Opitz, Schwerte, DE;

Assignee:

Max Planck Gesellschaft, Goettingen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
324 96 ; 324453 ;
Abstract

To measure potential differences in second-class conductors without interference potentials, there are provided a potential generator cooperating with a potential-measuring structure. This structure includes a substrate of electrically highly insulating and chemically inert material embedding optical indicators whose optical properties change as a function of the applied electric potential difference. Both the potential generator and the potential-measuring structure have boundary surfaces which are in contact with the second-class conductor and opposite surfaces interconnected by an equalizing conductor. A light-measuring device is arranged for intercepting light changes in the indicators, thus measuring the potential difference.


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