The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 13, 1987
Filed:
Sep. 14, 1984
Branko Palcic, Vancouver, British Columbia, CA;
Bruno Jaggi, Vancouver, British Columbia, CA;
Jan Nordin, North Vancouver, British Columbia, CA;
Other;
Abstract
An image scanner for microscopic objects. The image scanner has a microscope with a high precision computer controlled motor driven stage to provide X,Y plane displacements in order to scan microscopic objects under the microscope. There is an image sensor and a digitizer in association with the microscope to sense a horizontal image line or a two dimensional image and provide a digital representation of the line or image. A digital signal processor processes digitized signals from the sensor. There is a computer to control the mechanical and electronic scanning and to store and display information from the digital signal processor. Methods of scanning a microscopic object are also described. The methods comprise positioning the object on a motorized stage of a microscope having an image sensor in a focal plane. The object is scanned and signals received from the sensor during scanning are digitized. The digitized signals are processed with a digital signal processor in order to automatically recognize objects while the sample is being scanned. The processed information contained in the signals and the location coordinates of objects are stored. The methods include automatical revisiting of recognized objects for further analysis.