The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 1987

Filed:

Jun. 12, 1986
Applicant:
Inventors:

Toru Shimazaki, Tokyo, JP;

Yoshihiko Watanabe, Tokyo, JP;

Hideto Iwaoka, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324322 ; 324313 ;
Abstract

In measuring a number of echo signal, which normally attenuate chronologically, in a single pulse sequence, such as in multi-echo method or a multi-slice method, each echo signal is received and suitably amplified by a reception amplifier having predetermined levels of gain for different time periods during which the successive echo signals are processed such that the echo signals received at a data collection unit are all of substantially the same amplitude regardless of where they appear in the time sequence. The predetermined levels of gains are obtained by false scanning prior to actual image scanning and calculation and storing in a memory. As a result, the echo signals can be received within a dynamic range which is smaller than using the conventional system.


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