The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 1987

Filed:

May. 14, 1985
Applicant:
Inventors:

John E Keem, Bloomfield Hills, MI (US);

Gerald F Marshall, Grosse Pointe Woods, MI (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
378 84 ; 378 83 ;
Abstract

An improved X-ray monochromatizing subassembly, method and system are provided by a plurality of X-ray dispersive structures which are spaced and aligned to intercept X-rays and reflect monochromatized X-rays from the intercepted X-rays. The system includes a source of X-rays and an X-ray detector for detecting the monochromatized reflected X-rays. The monochromatized X-rays can be designed to be diverging, parallel or converging and can be designed for a particular wavelength of interest.


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