The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 06, 1987

Filed:

Mar. 21, 1986
Applicant:
Inventors:

Timothy L Blankenship, Palm Bay, FL (US);

Joseph G Nolan, III, San Jose, CA (US);

Assignee:

Harris Corporation, Melbourne, FL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
3241 / ; 324 / ; 324550 ; 371 21 ;
Abstract

A testing circuit for testing fuse elements in programmable memory devices. The circuit provides for testing whether the fuses have the proper resistance, both after manufacturing and after programming of the memory device. The testing circuit includes a current varying means which may include either a variable resistance or a variable current sink. The variable resistance is connected to a fuse element to form a voltage divider with the same. A sensing amplifier is connected at a node therebetween for sensing the current through the fuse element and, thus, the resistance of the same. The variable current sink provides variable current levels, thereby achieving the same above results.


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