The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 06, 1987
Filed:
Oct. 29, 1984
Applicant:
Inventors:
Hiroshi Hyodo, Kyoto, JP;
Naoki Yamada, Joyo, JP;
Kenichi Iwase, Joyo, JP;
Shinichi Kishimoto, Kuze, JP;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356339 ; 356442 ;
Abstract
The test solution in the measuring cell is regarded to be divided into a plurality of sections, and the quantity of scattered light from each section is continuously measured to give a plurality of independent series of signal. This measurement is carried out by scanning the measuring cell with a minute light flux periodically to obtain a plurality of measurements in a period. Out of the series of signals obtained, those containing abnormal scattered light signal are eliminated to determine accurate concentration and reaction process.