The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 1987
Filed:
Nov. 20, 1985
Applicant:
Inventor:
Katsuro Wakai, Hadano, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
371 25 ; 324 / ;
Abstract
A scan control apparatus performs data scan-in operation to data storage elements each constituting a bit of data unit. Data of the plural data storage elements designated by scan address are read out into a register where the data at the bit position designated by the scan address is replaced by data to be scanned-in. Subsequently, the plurality of the data storage elements are reset simultaneously to thereby set the data in the register to the original data storage elements.
Wakai, Katsuro. (1987). Scan control apparatus and method for data processing apparatus (U.S. Patent No. 4697267). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4697267
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