The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 1987
Filed:
Dec. 11, 1985
Lutz Bartelsen, Hamminkeln, DE;
Flachglas Aktiengesellschaft, , DE;
Abstract
Process for testing transparent material webs, particularly plate glass ribbons or the like, for material defects, in which the glass ribbon or the like conveyed in its longitudinal direction is scanned over its width in a scanning plane at right angles to its conveying plane and direction by means of a laser-produced flying light spot, the forward and back scattering produced by the inclusions is measured in each case one detection plane sloping with respect to the scanning plane, electrical signals are derived from the measured values obtained and said signals are processed for material defect identification, characterized in that a laser operating in the near IR-range is used as the light spot source, as well as apparatus for preforming this process.