The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 29, 1987

Filed:

Jun. 19, 1986
Applicant:
Inventors:

Mohanlal S Mansuria, Coral Springs, FL (US);

Rolf G Meinert, Wappingers Falls, NY (US);

Sevgin Oktay, Poughkeepsie, NY (US);

Carl D Ostergren, Montgomery, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01R / ;
U.S. Cl.
CPC ...
374 45 ; 3241 / ;
Abstract

A thermal tester for measuring the efficiency of a heat transfer device for cooling semiconductor chips is disclosed having a positioning means operable to position the heat transfer device in thermal contact with the chip. The positioning means is adjustable in at least 5 degrees of freedom. Temperature sensors are provided to sense the temperature of the chip, the chip support substrate and the positioning means adjacent the heat transfer device. Means is provided to dispose the chip and heat transfer device in a vacuum. Control means is also provided to adjust the temperature of the chip unitl it is the same as the substrate to thereby assure heat transfer occurs only from the chip to the positioning means by way of the heat transfer device. When this thermal balance is achieved the thermal resistance of the heat transfer device can be calculated.


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