The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 29, 1987
Filed:
Apr. 11, 1985
Applicant:
Inventors:
Joseph M Geary, Edgewood, NM (US);
Phillip R Peterson, Albuquerque, NM (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356124 ; 356125 ;
Abstract
An optical testing method and apparatus employing a non-interferometric technique, making use of axial intensity information, in which the intensity of the light pattern along the optical axis is calibrated to achieve improved measurement of spherical aberration.
Geary, Joseph. (1987). Method of measuring spherical aberration and apparatus therefor (U.S. Patent No. 4696569). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4696569
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile