The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 22, 1987

Filed:

Dec. 14, 1984
Applicant:
Inventors:

Toshio Mimoto, Nara, JP;

Keizo Sakiyama, Kashihara, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G05F / ;
U.S. Cl.
CPC ...
307297 ; 3072 / ; 3072021 ; 3072 / ;
Abstract

An integrated circuit includes a plurality of threshold-value compensatory programmable elements integrally incorporated into a semiconductor integrated circuit, wherein, during the inspection process after assembly, the programmable elements store stationary data related to varied threshold voltages occurred during assembly process so that the varied substrate bias voltages can be restored to an ideal level by applying compensations as required. This circuit is extremely advantageous in that it effectively compensates for even the slightest variation of the threshold voltage in the integrated circuit using its extremely simplified circuit configuration, and in light of the conventional tendency in which redundant circuits containing a variety of chip parts each having a substantial area are used, against the needs for high-density part installation, the circuit embodied by the present invention effectively and securely provides means for realizing higher yield of monolithic semiconductor integrated circuits.


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