The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 08, 1987

Filed:

Dec. 03, 1985
Applicant:
Inventors:

Harutaka Taniguchi, Kanagawa, JP;

Takafumi Fumoto, Kanagawa, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250343 ; 250344 ; 250345 ;
Abstract

An infrared analyzer where infrared radiation is passed through a measurement cell containing a material that includes a component that absorbs infrared radiation. The radiation exiting the measurement cell passes into a first detector, through an optical filter to a second infrared radiation detector. By analyzing the outputs from each detector and by knowing the characteristics of the optical filter, the concentration of certain infrared absorbing components in the material can be determined.


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