The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 1987
Filed:
Oct. 01, 1985
Tyce Fitzmorris, Lake Park, FL (US);
Eric Espenhahn, Lake Park, FL (US);
Jamie Pereira, North Palm Beach, FL (US);
Vistech Corporation, Lake Park, FL (US);
Abstract
A method and apparatus for inspecting the sidewalls of containers on a continuously-moving conveyor includes recording instantaneous upper and lower angularly-spaced images of the bottles as they pass. Data on the images is stored as numeric data indicating the grey shade of each pixel in a matrix of pixels, which matrix is examined for edges and then divided based on detected edges into inspection windows. The windows are subject to separate criteria between typically scuffed areas and open areas. The occurrence of pixels in at least three grey ranges reflecting clear glass, opaque glass, and scuffed glass, together with the correlation of such occurrences between angularly-spaced views and upper and lower views, is processed to detect defects. A memory stores a status indication in a queue representing the acceptability of the bottles being examined, which are then segregated by a downstream reject kicker mechanism.