The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 1987

Filed:

Jul. 13, 1984
Applicant:
Inventors:

Masahiko Naoe, Tokyo, JP;

Shozo Ishibashi, Hino, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
20419211 ; 2041922 ; 204298 ; 250398 ; 250424 ; 427 39 ;
Abstract

There is provided a method of ion beam generation wherein a plurality of opposing targets are sputtered by plasma generated in a space confined by these targets and ionized particles thereby generated are led outside of the above space in a given direction under presence of an electric field. In connection to this method, an ion beam generator is disclosed comprising a plurality of targets, a plasma generating means to generate plasma necessary to sputter these targets in a space confined by these targets and a control electrode to lead ionized particles generated by sputtering with the above plasma outside of such space under control of their energy.


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