The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 01, 1987

Filed:

Jun. 19, 1985
Applicant:
Inventors:

William L Davies, Stanton St. John, GB;

Clive E Hahn, Radley, GB;

Roy K Jackson, Oxford, GB;

Thomas A McGraghan, Fringeford, GB;

Eileen Palayiwa, Marston, GB;

Basil R Sugg, Oxford, GB;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356361 ;
Abstract

An apparatus and method for analysing a gas of the kind adapted to produce an interference pattern displacements of which are indicative of changes of the constitution of the gas involves exposing an array 8 of photosensitive elements to the interference pattern. Respective digital indications of the intensity of the interference pattern falling of the elements are produced by means of a timing circuit 16 adapted to clock data out of the array 8 as a series of analogue pulses which are held by a fast peak detector 17 and converted by an analogue-to-digital converter 18 into digital indications. The position of a principal peak of the interference pattern is then determined by means of a microprocessor (not shown) adapted to determine the best fit of the digital indications with appropriate pre-stored values.


Find Patent Forward Citations

Davies, William. (1987). Gas analysis apparatus and method (U.S. Patent No. 4690562). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4690562

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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