The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 25, 1987

Filed:

Feb. 21, 1985
Applicant:
Inventors:

John B Collins, Westport, CT (US);

George E Kisslak, Huntington, CT (US);

Assignee:

The Perkin-Elmer Corporation, Norwalk, CT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364497 ; 364577 ; 364578 ;
Abstract

A method and apparatus to optimize a characteristic of measured data in an adjustable instrument for chemical analysis. The characteristic is measured at a plurality of adjustment points about a start point. Through parabolic interpolation of the data a conjugate vector is formed and the best operating point thereon is selected. Then measurements of the characteristic are taken as a function of the adjustable parameters about the best point on the conjugate vector. These data are used in a parabolic interpolation to define a second conjugate vector. The best operating point on the second conjugate vector is the optimum point of the instrument.


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