The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 25, 1987
Filed:
Feb. 24, 1986
Applicant:
Inventor:
Richard B Haigh, Buchanan, MI (US);
Assignee:
Leco Corporation, St. Joseph, MI (US);
Primary Examiner:
Int. Cl.
CPC ...
C25D / ; C25F / ; C25F / ; G01N / ;
U.S. Cl.
CPC ...
2042 / ; 204228 ; 204275 ; 356410 ;
Abstract
An analyzer for acid-soluble aluminum in a steel sample precisely controls the etching charge by monitoring the etching current level and integrating the current with time. Once a predetermined charge is reached, the etching current is terminated. In a preferred embodiment, the etching cell is stacked above the mixing and developing chamber such that etching fluid flow is by gravity between these elements.
Haigh, Richard. (1987). Etching charge measurement system (U.S. Patent No. 4689132). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/4689132
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile