The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 18, 1987
Filed:
Nov. 25, 1985
Applicant:
Inventor:
Richard J Chaban, Ventura, CA (US);
Assignee:
Warner Lambert Technologies, Inc., Morris Plains, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ; G02B / ;
U.S. Cl.
CPC ...
250201 ; 350527 ;
Abstract
An autofocus mechanism for a microscope comprises an arrangement of optical elements aligned along a single optical path. The arrangement includes a single illumination source which provides both a viewing component and a positioning component. Included in the autofocus arrangement are optical elements to eccentrically reference the positioning component for determining the focus condition of the instrument. The autofocus arrangement also includes a detector for determining the degree of eccentricity of the measuring ray and to make adjustments in the microscope according to this eccentricity to bring the viewed object into focus.