The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 1987
Filed:
Apr. 09, 1985
Hans-Peter Kugler, Zaisenhausen, DE;
Norbert Eisenreich, Pfinztal, DE;
Wolfgang Liehmann, Karlsruhe, DE;
Abstract
A method is disclosed for measuring the rate and/or extent of movement of oscillatory element positioned on an oscillating system by passing a reference beam towards a reference detector over a reference edge. The reference edge is fixed relative to the element. The measurement beam is directed towards the measurement detector over a measurement edge of a surface adapted to move together with the element relative to the reference edge. The movement of the measurement edge cuts the measurement beam as it moves into the path of the measurement beam. The rate and/or extent of movement of the element relative to the reference edge is determined by comparing the illumination received by each of the detectors. Apparatus is also disclosed for measuring the rate and/or extent of movement of an oscillatory element positioned on an oscillating system including a measurement edge adapted to move together with the element. A reference edge is maintained stationary relative to the measurement edge. A device is provided for generating measurement and reference beams directed towards each of the measurement and reference edges whereby at least the measurement beam is cut by the measurement edge upon movement of the measurement edge relative to the reference edge. Detectors are provided which are adapted to measure the amount of illumination cut by the measurement and reference edges and to generate a corresponding signal.