The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 1987
Filed:
Jan. 13, 1986
Michael R Brininstool, San Diego, CA (US);
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Abstract
A combination optical time domain reflectometer (OTDR) and insertion loss measurement system evaluates environmental stress effects on a test fiberoptic cable. A multiport coupler joins the OTDR and insertion loss system to the test fiberoptic cable via a precursor of like type and length with respect to the test cable. Nondestructive analysis, continuously and throughout, measures attenuation between any two points within the equilibrium region of the test cable, the quality of the splice between the precursor and the test cable and the degree of EMD disruption. Attenuation measurements over operating environmental conditions can be made to precisely determine the maximum allowable cable length. Visual readouts and permanent records of the EMD disruption and resultant excess attenuation provide real time analysis so that responsive corrective actions can be made.