The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 1987
Filed:
Mar. 15, 1985
Toshiro Masuda, Tokyo, JP;
Kouichi Ishizuka, Koshigaya, JP;
Toshiji Fujita, Niiza, JP;
Yoshio Kinoshita, Mihara, JP;
Toppan Printing Co., Ltd., both of, JP;
Mitsubishi Jukogyo Kabushiki Kaisha, both of, JP;
Abstract
The present invention relates to an inspecting device for a print which can scan the entire print pattern of a printed sheet by an optical detecting device, detects the image information of the print pattern at every pixel, calculates the difference between the detected image information with reference information, delays the differential signal in several pixels in the scanning direction of the optical detecting device, calculates the difference between the differential signal and the delayed differential signal, sets a threshold level to the twice differential signal produced from the result, and judges the production of a printing defect when the twice differential signal exceeds the threshold level, thereby accurately detecting the printing defect even when the entire variation in the color density occurs on the printed sheet.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile