The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 1987

Filed:

Apr. 04, 1985
Applicant:
Inventors:

Keiki Yamaguchi, Tokyo, JP;

Kazuya Hoshino, Tokyo, JP;

Hideto Iwaoka, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
324308 ; 324309 ;
Abstract

An object which can provide a reference for measuring the intensity of a primary magnetic field, is positioned in the vicinity of a subject being examined. A variation in the primary magnetic field intensity is detected, based on a frequency shift of data observed of the object, and is used to control the primary magnetic field intensity, or reference frequency for phase detection, or to correct image data. In this manner image quality is prevented from being degraded due to the variation of the primary magnetic field intensity.


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