The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 1987

Filed:

Dec. 28, 1984
Applicant:
Inventors:

Akio Tsumura, Osaka, JP;

Suguru Yamamoto, Osaka, JP;

Chiharu Miyaake, Osaka, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356367 ; 356366 ;
Abstract

An apparatus for measuring an optical axis direction in which an intensity of the light transmissive to a specimen to be measured disposed between two polarizers is measured by an orthogonal Nicol optical system which uniaxially comprises a light source, said two polarizers, and a light receptor thereby determining the optical axis direction of the specimen to be measured. The apparatus comprises a conveyor for continuously moving the specimen in an elongated form in the direction intersecting with the orthogonal Nicol optical system at a right angle. An intensity of the transmissive light is measured during the period of time when the specimen is fed from one side of a casing, and removed from the other side of the casing. The casing encases the optical system.


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