The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 1987
Filed:
Jul. 16, 1986
Hitachi, Ltd., Tokyo, JP;
Abstract
An automated analyzing apparatus with a photometer including an entrance slit permitting passing therethrough of the entirety or a portion of a convergent light beam transmitted successively through a plurality of sample measurement cells each containing a sample solution therein and a sensor converting the quantity of light passed through the entrance slit into a physical quantity which is an objective of measurement. A scattered light sensor is disposed between the sample measurement cells and the entrance slit at a position where the sensor is not irradiated with a straight advancing component of the light beam, whereby measurement of immunity-related tests on the basis of the intensity of scattered light can be made together with measurement of biochemical tests on the basis of the intensity of transmitted light.