The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 1987

Filed:

Aug. 30, 1985
Applicant:
Inventor:

Surendra K Chawla, Akron, OH (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356353 ; 356 355 ; 356347 ; 356354 ;
Abstract

A nondestructive means of testing tires for subsurface defects by speckle-shearing interferometry. The tire is illuminated with a beam of coherent light. The light reflected from a surface of the tire is directed through a converging lens having one-half of one of its surfaces covered by a transparent plate having flat parallel sides such that a photographic media is exposed to a first pair of focused images of the tire displaced with respect to one another. The tire is then subjected to a stress, and a second pair of slightly displaced images is recorded on the same photographic media. The photographic media is developed to form a transparency, and then a first surface of the developed photographic media is illuminated with a collimated white light source. Interference fringes that are observed by viewing the opposite surface of the photographic media may then be analyzed.


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